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81. In-process optical metrology for
 
$211.65
82. Recent Advance in Metrology and
 
83. URSI Register of National Standards
 
$139.27
84. Characterization and Metrology
$56.50
85. Advanced Mathematical & Computational
 
$70.00
86. Microsystems Metrology and Inspection
 
$80.00
87. Machine Vision Systems for Inspection
$19.48
88. Métrologies Constitutionnelle
 
$90.00
89. Metrology (Six Sigma Research
 
$23.61
90. A new treatise on elements of
 
$140.00
91. Optical Fabrication, Testing,
 
$90.00
92. Machine Vision Systems for Inspection
 
$80.00
93. Machine Vision and Three-dimensional
 
94. Applications of Optical Metrology
 
95. Practical metrology, (English
$16.60
96. An Important Question in Metrology:
 
97. 3rd Symposium of the Technical
$247.81
98. Laser Metrology & Machine
 
$27.00
99. The Origins of Metrology (Monograph
 
$80.00
100. Optp-Ireland 2002: Optical Metrology,

81. In-process optical metrology for precision machining, 31 March-2 April 1987, The Hague, The Netherlands (Proceedings / SPIE)
 Paperback: 217 Pages (1987)

Isbn: 0892528370
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82. Recent Advance in Metrology and Fundamental Constants (International School of Physics Enrico Fermi, 146) (International School of Physics ""Enrico Fermi"", 146)
 Hardcover: 830 Pages (2001-10)
list price: US$249.00 -- used & new: US$211.65
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Asin: 1586031678
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Editorial Review

Product Description
The exchange between physics and metrology is always fascinating and exciting. Many are the open problems in physics that call for extremely precise standards, many are the advances in metrology made possible by a deep and assiduous study of the underlying physics. One has just to think of the enormous sophistication required in the measurements of some absolute quantities such as the Avogadro, the gas, or the gravitational constants. It is also worth noticing that not only the units of a metrological system are interrelated through the fundamental constants, but also the latter find their full significance when they are determined through the most exacting metrological experiments. Over the past decade many improvements took place and these are discussed in this book; from one side the old caesium SI second definition has found a new realisation, with the "fountain" approach, replacing the classical thermal atomic beam. The use of "cold" atom techniques, in which bunches of inert atoms are collected, slowed down, and cooled, has opened a number of new and unexpected avenues for metrology and fundamental constants; one of these possibilities being the atom interferometry. Another important "quantum jump" was the demonstration of the possibility of performing a direct frequency division in the visible, using ultra short femtosecond pulses. In addition, the possibility of "counting" electrons or photons gave a fundamental support to the development of single-electron capacitance standards and to new scenarios in the absolute calibration of photo-detectors ... Read more


83. URSI Register of National Standards Laborattheoriesfor Electromagnetic Metrology,
 Hardcover: 144 Pages (1990-01-01)
list price: US$140.00
Isbn: 0852741278
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Editorial Review

Product Description
The URSI Register is a comprehensive and up to date survey of National Standards Laboratories, the types of measurements they can make, their results and other relevant information. The register consists of an entry for each National Laboratory, usually in the following format: organisation, national standards, calibration facilities. THe coverage of electromagnetic metrology is comprehensive and includes measurements of time and frequency, of DC and LF electrical and magnetic quantities, and of radio and microwave frequencies with extensions where appropriate to infrared and optical frequencies. The register will be an invaluable source of information in Government laboratories and universities for those who work in the field of electromagnetic metrology. It will also be especially useful for industrial laboratories where this type of information is increasingly required to take advantage of export opportunities. ... Read more


84. Characterization and Metrology for ULSI Technology 2000: International Conference (AIP Conference Proceedings)
 Hardcover: 708 Pages (2001-03-01)
list price: US$185.00 -- used & new: US$139.27
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Asin: 156396967X
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Editorial Review

Product Description
Proceedings of the International Conference on Characterization and Metrology for ULSI Technology, held in Gaithersburg, Maryland, June 26-29, 2000. Topics covered included front end processes, contamination and defect analysis, and lithography. Includes a CD-ROM for use with the text. System requirements not listed. ... Read more


85. Advanced Mathematical & Computational Tools in Metrology IV (Series on Advances in Mathematics for Applied Sciences) (v. 4)
Hardcover: 316 Pages (2000-06)
list price: US$123.00 -- used & new: US$56.50
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Asin: 9810242166
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Editorial Review

Product Description
Designed to present and promote reliable and effective mathematical and computational tools in metrology, and understand better the modelling, statistical and computational requirements in metrology. DLC: Mensuration. ... Read more


86. Microsystems Metrology and Inspection (Proceedings of SPIE/EUROPTO Series)
 Paperback: 23 Pages (1999-09)
list price: US$70.00 -- used & new: US$70.00
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Asin: 081943311X
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87. Machine Vision Systems for Inspection and Metrology VIII: 21-22 September 1999, Boston, Massachusetts (Proceedings of Spie--the International Society for Optical Engineering, V. 3836.)
 Paperback: 252 Pages (1999-08)
list price: US$80.00 -- used & new: US$80.00
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Asin: 0819434299
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88. Métrologies Constitutionnelle Et Primitive, Comparées Entre Elles Et Avec La Métrologie D'ordonnances, Volume 1 (French Edition)
by J F. Lesparat
Paperback: 380 Pages (2010-03-05)
list price: US$33.75 -- used & new: US$19.48
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Asin: 1146690592
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Editorial Review

Product Description
This is an EXACT reproduction of a book published before 1923. This IS NOT an OCR'd book with strange characters, introduced typographical errors, and jumbled words.This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. ... Read more


89. Metrology (Six Sigma Research Institute Series)
by Jerome V. Scholle
 Hardcover: 83 Pages (1993-07)
-- used & new: US$90.00
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Asin: 0201634147
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90. A new treatise on elements of mechanics establishing strict precision in the meaning of dynamical terms accompanied with an appendix on duodenal arithmetic and metrology
by John W. 1824-1885 Nystrom
 Paperback: 358 Pages (2010-09-08)
list price: US$32.75 -- used & new: US$23.61
(price subject to change: see help)
Asin: 1147901368
Canada | United Kingdom | Germany | France | Japan
Editorial Review

Product Description
This is a reproduction of a book published before 1923.This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process.We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide.We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. ... Read more


91. Optical Fabrication, Testing, and Metrology II (Proceedings of Spie)
 Paperback: 698 Pages (2005-10-13)
list price: US$140.00 -- used & new: US$140.00
(price subject to change: see help)
Asin: 0819459836
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92. Machine Vision Systems for Inspection and Metrology VII: 4-5 November, 1998, Boston, Massachusetts (Proceedings of Spie--the International Society for Optical Engineering, V. 3521.) (No. 7)
 Paperback: 386 Pages (1998-10)
list price: US$90.00 -- used & new: US$90.00
(price subject to change: see help)
Asin: 0819429821
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93. Machine Vision and Three-dimensional Imaging Systems for Inspection and Metrology (Proceedings of Spie)
 Paperback: 304 Pages (2001-02-12)
list price: US$80.00 -- used & new: US$80.00
(price subject to change: see help)
Asin: 0819438545
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94. Applications of Optical Metrology Techniques and Measurements II (Proceedings of Spie)
 Paperback: 214 Pages (1983-12)
list price: US$42.00
Isbn: 0892524510
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95. Practical metrology, (English Language Book Society textbook series)
by K. J Hume
 Unknown Binding: 256 Pages (1965)

Asin: B0007K2WKO
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96. An Important Question in Metrology: Based Upon Recent and Original Discoveries: A Challenge to "the Metric System." and an Earnest Word with the English-Speaking ... On Their Ancient Weights and Measures
by Charles Adiel Lewis Totten
Paperback: 262 Pages (2010-04-22)
list price: US$27.75 -- used & new: US$16.60
(price subject to change: see help)
Asin: 1149118504
Canada | United Kingdom | Germany | France | Japan
Editorial Review

Product Description
This is an EXACT reproduction of a book published before 1923. This IS NOT an OCR'd book with strange characters, introduced typographical errors, and jumbled words.This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. ... Read more


97. 3rd Symposium of the Technical Committee (TC8) on Theoretical Metrology: Proceedings, Berlin, GDR 15-17 Oct. 1986 (IMEKO TC series)
 Unknown Binding: 237 Pages (1987)

Isbn: 9635926405
Canada | United Kingdom | Germany | France | Japan

98. Laser Metrology & Machine Performance V
Hardcover: 392 Pages (2001-07-12)
list price: US$298.00 -- used & new: US$247.81
(price subject to change: see help)
Asin: 1853128902
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Editorial Review

Product Description
Reporting on the latest international standards, calibration and certification procedures, this volume contains the official proceedings of the Fifth International Conference on Laser Metrology, Machine Tool, CMM and Robot Performance. Areas highlighted include:

Machine tool condition monitoring and calibration.

Co-ordinate metrology and its application to manufacturing performance and industrial inspection.

New techniques in performance assessment and verification.

Numerical and computational tools. ... Read more


99. The Origins of Metrology (Monograph Series)
by Daniel McLean McDonald
 Hardcover: 143 Pages (1992-12-01)
list price: US$27.00 -- used & new: US$27.00
(price subject to change: see help)
Asin: 095194200X
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Editorial Review

Product Description
Cambridge's new McDonald Institute for Archaeological Research owes its origin to the generosity of Daniel McLean McDonald, and it is an appropriate act of pietas that the Institute's first monograph should be a collection of his writings. Dr McDonald was fascinated by systems of weighing and measuring and his investigations ranged from Egypt and Sumer through Classical times to the Middle Ages and the New World. He saw very clearly how the use of liquid to measure capacity imposed a relationship between units of weight and those used to measure volume and hence length; and for him the units employed by the ancients possessed a coherence that reflected a very pragmatic understanding of the real world. His writings on metrology do not seem to have been written for publication and are pretty cryptic to the uninitiated, and some of his hypotheses on the relationship between various systems are, to say the least, bold - but it is from such speculations that understanding grows, and understanding intelligence and its origins is one of the aims of the McDonald Institute and its new Cambridge Archaeological Journal. ... Read more


100. Optp-Ireland 2002: Optical Metrology, Imaging, and Machine Vision (SPIE P.)
 Paperback: 282 Pages (2003-03)
list price: US$80.00 -- used & new: US$80.00
(price subject to change: see help)
Asin: 0819446580
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