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61. Gravitational Measurements, Fundamental Metrology and Constants (NATO Science Series C: (closed)) | |
Hardcover: 560
Pages
(1988-06-30)
list price: US$359.00 -- used & new: US$250.98 (price subject to change: see help) Asin: 9027727090 Canada | United Kingdom | Germany | France | Japan | |
62. Fringe '97 (Optical Metrology) by Werner Jueptner | |
Hardcover: 500
Pages
(1997)
-- used & new: US$141.66 (price subject to change: see help) Asin: 3055017919 Canada | United Kingdom | Germany | France | Japan | |
63. Metrology-based Control for Micro-manufacturing (Proceedings of Spie) by Kenneth W., Jr. Tobin, Fred Lakhani | |
Paperback: 164
Pages
(2001-06-05)
list price: US$70.00 -- used & new: US$70.00 (price subject to change: see help) Asin: 0819439533 Canada | United Kingdom | Germany | France | Japan | |
64. The impact of Israel on Western philosophy (Archives for mosaical metrology and mosaistics) by Ed Metzler | |
Hardcover: 32
Pages
(1993)
-- used & new: US$170.00 (price subject to change: see help) Asin: 3924448086 Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description |
65. Metrology, Inspection, And Process Control For Microlithography XVIII (Proceedings of Spie) | |
Paperback: 1398
Pages
(2004-05-31)
list price: US$225.00 -- used & new: US$225.00 (price subject to change: see help) Asin: 0819452882 Canada | United Kingdom | Germany | France | Japan | |
66. Characterization and Metrology for ULSI Technology 2005 (AIP Conference Proceedings / Materials Physics and Applications) | |
Hardcover: 667
Pages
(2005-09-29)
list price: US$245.00 -- used & new: US$99.79 (price subject to change: see help) Asin: 0735402779 Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description The worldwide semiconductor community faces increasingly difficult challenges in the era of silicon nanotechnology and beyond. The magnitude of these challenges demands special attention from the metrology and analytical measurements community. New paradigms must be found. Adequate research and development for new metrology concepts are urgently needed. Characterization and metrology are key enablers for developing new semiconductor technology and in improving manufacturing. This book summarizes major issues and gives critical reviews of important measurement techniques that are crucial to continuing the advances in semiconductor technology. It covers major aspects of process technology and most characterization techniques for silicon research, including development, manufacturing, and diagnostics. The book also covers emerging nano-devices and the corresponding metrology challenges that arise. |
67. Catalog of federal metrology and calibration capabilities by Kathryn O. Leedy | |
Paperback: 76
Pages
(1980-01-01)
list price: US$13.99 -- used & new: US$13.99 (price subject to change: see help) Asin: B00427YPL2 Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description |
68. Laser Metrology and Machine Performance IV | |
Hardcover: 500
Pages
(1999-07)
list price: US$284.90 -- used & new: US$284.89 (price subject to change: see help) Asin: 1853126616 Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description It contains the edited versions of papers given at the fourth international conference on Laser Metrology and Machine Performance, held July 13-15, 1999 in Newcastle, UK, and organized to promote interaction between research groups and users. |
69. Microsystems Engineering: Metrology and Inspection III, 23-25 June 2003 Munich, Germany (Proceedings of Spie) | |
Paperback: 208
Pages
(2004-01)
list price: US$70.00 -- used & new: US$70.00 (price subject to change: see help) Asin: 0819450154 Canada | United Kingdom | Germany | France | Japan | |
70. Advances in Fabrication and Metrology for Optics and Large Optics (Spie Volume 966) | |
Paperback: 375
Pages
(1989-01)
list price: US$65.00 -- used & new: US$189.99 (price subject to change: see help) Asin: 0819400017 Canada | United Kingdom | Germany | France | Japan | |
71. Metrology: Webster's Facts and Phrases by Icon Group | |
Paperback: 70
Pages
(2008-11-26)
list price: US$28.95 -- used & new: US$28.95 (price subject to change: see help) Asin: B001Q92DV8 Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description |
72. Advanced Mathematical Tools in Metrology: Proceedings of the International Workshop (Series on Advances in Mathematics for Applied Sciences) by P. Ciarlini | |
Hardcover: 273
Pages
(1994-05)
list price: US$91.00 Isbn: 9810217587 Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description |
73. Advanced Mathematical Tools in Metrology III (Series on Advances in Mathematics for Applied Sciences) | |
Hardcover: 284
Pages
(1997-06)
list price: US$99.00 -- used & new: US$21.61 (price subject to change: see help) Asin: 9810229186 Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description |
74. Metrology; or, An exposition of weights and measures, chiefly those of Great Britain and France: comprising tables of comparison, and views of various ... reports, & other important documents by Patrick Kelly | |
Paperback: 158
Pages
(2010-08-04)
list price: US$21.75 -- used & new: US$16.03 (price subject to change: see help) Asin: 1176831844 Canada | United Kingdom | Germany | France | Japan | |
75. Metrology, Inspection, and Process Control for Microlithography Xiii: 15-18 March, 1999, Santa Clara, California (Proceedings of Spie--the International Society for Optical Engineering, V. 3677.) | |
Paperback: 1052
Pages
(1999-06)
list price: US$160.00 -- used & new: US$155.00 (price subject to change: see help) Asin: 0819431516 Canada | United Kingdom | Germany | France | Japan | |
76. Two-And Three-Dimensional Vision Systems for Inspection, Control and Metrology (Proceedings of Spie) | |
Paperback: 214
Pages
(2004-02)
list price: US$70.00 -- used & new: US$70.00 (price subject to change: see help) Asin: 0819451533 Canada | United Kingdom | Germany | France | Japan | |
77. Selected Papers on Speckle Metrology (S P I E Milestone Series, Vol 35) | |
Paperback: 668
Pages
(1991-07)
list price: US$118.00 -- used & new: US$118.00 (price subject to change: see help) Asin: 0819406392 Canada | United Kingdom | Germany | France | Japan | |
78. Metrology and Precision Engineering (European Mechanical Engineering Series) by A .J.T. Scarr | |
Hardcover: 213
Pages
(1967)
Asin: B0006BXT9C Canada | United Kingdom | Germany | France | Japan | |
79. Musculoskeletal Clinical Metrology by N. Bellamy | |
Hardcover: 384
Pages
(1993-08-31)
list price: US$349.00 -- used & new: US$342.32 (price subject to change: see help) Asin: 0792388283 Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description |
80. Optics in metrology and quality assurance: February 6-7, 1980, Los Angeles, California (Proceedings of the Society of Photo-optical Instrumentation Engineers ; v. 220) | |
Paperback: 196
Pages
(1980)
Isbn: 0892522488 Canada | United Kingdom | Germany | France | Japan | |
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