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$57.13
1. Transmission Electron Microscopy:
$71.47
2. Scanning Electron Microscopy and
$48.20
3. Electron Microscopy, 2nd Edition
$103.20
4. Advanced Computing in Electron
$39.99
5. Bioimaging: Current Techniques
$71.97
6. Physical Principles of Electron
$67.20
7. Scanning and Transmission Electron
$140.39
8. Electron Microscopy of Model Systems,
 
$24.99
9. Principles and Techniques of Electron
 
$150.05
10. Scanning Electron Microscopy and
 
$20.99
11. Three-Dimensional Structure of
$142.21
12. Scanning Electron Microscopy:
$135.20
13. Scanning Transmission Electron
$34.06
14. Introduction to Scanning Transmission
$77.39
15. Transmission Electron Microscopy
$70.97
16. Handbook of Sample Preparation
$26.26
17. Electron Microprobe Analysis and
$30.00
18. Electron Microscopy and Analysis,
 
19. Electron Diffraction in the Electron
$159.00
20. Transmission Electron Microscopy:

1. Transmission Electron Microscopy: A Textbook for Materials Science
by David B. Williams, C. Barry Carter
Paperback: 832 Pages (2009-08-05)
list price: US$99.00 -- used & new: US$57.13
(price subject to change: see help)
Asin: 0387765026
Average Customer Review: 5.0 out of 5 stars
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Editorial Review

Product Description

This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment.

... Read more

Customer Reviews (16)

5-0 out of 5 stars A good introduction for the typical materials scientist
Dave Williams and Barry Carter have done a good job assembling this introduction to transmission electron microscopy based on their long and active careers in teaching and research.For the typical materials science upper class undergraduate or beginning graduate student, this textbook should serve as a good introduction.Teaching this complex and multifaceted technique is a herculean task--let alone writing a text book!That said, this is not the kind of book that I would have preferred as a novice in this field.I usually prefer books that concentrate on the more difficult and mathematically challenging concepts and leave other topics to anthologies such as this book or to review articles.Although this book gives a pretty reasonable introduction to the Howie-Whelan equations, it does not really go into Cowley-Moodie mulitislice theory.This is to be expected really, since understanding multislice theory requires the reader to have a stronger physics and mathematics background than that possessed by most materials scientists.However, for the student who is already quite familiar with the Schrodinger equation and has the equivalent of a B.S. in physics (as I did when I started materials science grad school) I would recommend Marc De Graef's book Introduction to Conventional Transmission Electron Microscopy (Cambridge Solid State Science Series) as a more satisfying introduction to TEM (and which addresses both the Howie-Whelan and multislice approaches--as well as the unifying concept of the Sturkey scattering matrix).After reading De Graef's book you can then read Williams and Carter for an introduction to many other important topics.

4-0 out of 5 stars waste too many pages
Catalogs and appendix of four books at the begining and ending of each book are extractly the same. Why do they put them in all four books to increase the whole pages and increase the price. The four books could be two books of same pages with no difference in contents.
Beside that, it's a very good text book.

5-0 out of 5 stars TEM Bible
I bought this book as soon as I found out I would likely get a job working with TEMs.I had already bought a very physics oriented book by Reimer that is also excellent, but this book is simply a joy to read.Ample color diagrams and real micrographs together with witty, keen narrative make it the first technical book in years that I have read till the wee hours of the morning.I think that if you can read the whole book and retain 90% of what you have read and have the opportunity to apply it in real life on an actual TEM then you will be able to call yourself a TEM expert of sorts.

I have found that reading the Reimer text together with this one makes a hard to beat combination. When the physics gets too tough in Reimer I take a break and read this text and get a better intuitive grasp of the material or an alternate derivation with a few less triple integrals, then delve back into Reimer with renewed vigor.

To the authors, I would like to buy you both a round of beers some day, this text is timely and I am glad to have found it when I did.

5-0 out of 5 stars The bible of electron microscopy
If you are ever going to touch an electron microscope - especially a transmission type electron microscope - make sure that you have this book readily available to you. You do not necessarily need the new edition. The contents are pretty much the same. However - while the first edition was easy to read, the second is even more so. The occasional colour images and a modernized language really do help. Also make sure to get the paperback edition, which is conveniently divided into four books.

4-0 out of 5 stars good book for TEM
A very good book for understanding all the backgrounds in TEM,very detailed. But it might be a little difficult for the beginners.If you have a teacher to assist you read through the book, and you can consult him or her frequently, it is much better. ... Read more


2. Scanning Electron Microscopy and X-ray Microanalysis
by Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
Hardcover: 689 Pages (2003-02)
list price: US$99.00 -- used & new: US$71.47
(price subject to change: see help)
Asin: 0306472929
Average Customer Review: 5.0 out of 5 stars
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This text provides students as well as practitioners(engineers, technicians, physical and biological scientists,clinicians, and technical managers) with a comprehensive introductionto the field of scanning electron microscopy (SEM) and X-raymicroanalysis. The authors emphasize the practical aspects of thetechniques described. Topics discussed include user-controlledfunctions of scanning electron microscopes and x-ray spectrometers,the characteristics of electron beam - specimen interactions, imageformation and interpretation, the use of x-rays for qualitative andquantitative analysis and the methodology for structural analysisusing electron back-scatter diffraction. SEM sample preparationmethods for hard materials, polymers, and biological specimens arecovered in separate chapters. In addition techniques for theelimination of charging in non-conducting specimens are detailed. Adata base of useful parameters for SEM and X-ray micro-analysiscalculations and enhancements to the text chapters are available on anaccompanying CD. This is the third edition of this highly acclaimed text and has beenextensively revised. The text has been used in educating over 3,000students at the Lehigh SEM short course as well as thousands ofundergraduate and graduate students at universities in every corner ofthe globe. The authors have made extensive changes to the text andfigures in this edition as a result of their experience in teachingthe various concepts of SEM and x-ray microanalysis. ... Read more

Customer Reviews (8)

5-0 out of 5 stars Excellent so far.
I'm reading this book and an older edition of the Reimer text for in independent study course in SEM.While I'm only three chapters into both texts, the Goldstein text seems more readable.I like the writing style, and it doesn't seem to sacrifice in any technical aspect.

It is also very well illustrated.For a book about an imaging technology, this is obviously quite important.There are many instances where there are sets of images to compare the results achieved with varied operating parameters.

The text is well organized.It begins with an assumption that you know some basic physics and chemistry, but doesn't require any background in microscopy.Both the Table of Contents and Index are detailed enough to enable specific searches for specific subject matter.

This is a textbook I look forward to reading in the evening, and one that I look forward to finishing.It matches very well with the practical work I'm doing on the SEM.

5-0 out of 5 stars The Bible of All Scanning Electron Microscopy Books
If you are like me and had to use a Scanning Electron Microscope or SEM, you want to start with the basics that everyone goes by.This book is a safe bet that most everyone knows about.Plus, it is written with very little background in the world of electron microscopy.Too many authors to list but it's wonderful that alot of experts got together to present this material in clear, concise manner.Before you grab your solid-state physics book or check Wikipedia, just relax and page through it since this book pretty much makes it easy for you.

Chapters are arranged by the following: What is SEM?, How SEM works?, and Why are we interested with SEM?That's the easiest way to explain rather than list all the chapters.If you have a specific question, you don't even have to read through the previous chapters (if you have rough understanding).The size of this book is a BIG PLUS.It's compact compared to the monsterous Transmission Electron Microscopy (TEM) book by Barry Carter which is another great reference.For this price, you would be lucky to find another good reference book under $100 with such relevant information.

4-0 out of 5 stars Excellent outline of SEM and X-Ray microanalysis
This book is a comprehensible review of principles and methods of SEM and X-ray microanalysis write in a single and elegant language. The authors avoid using mathematical formulas in the description and demonstration which turn it an atractive book to all scientists and even the beginners.

5-0 out of 5 stars Great Book !!
This ought to be the dream book of those who do SEM imaging. The first half or say first five/six chapters are solely devoted to fundamentals of SEMs and the rest of the chapters are dealing generation of X-rays and concentrate on EDS. I have not yet finished reading this book. But certainly recommend to other SEM users to possess this book and read it as and when required.

5-0 out of 5 stars Book
The book is very good. I can learn a lot about the SEM from this book. The cd has also some interesting pictures, additional information. ... Read more


3. Electron Microscopy, 2nd Edition
by John J. Bozzola, Lonnie D. Russell
Hardcover: 670 Pages (1998-10)
list price: US$160.95 -- used & new: US$48.20
(price subject to change: see help)
Asin: 0763701920
Average Customer Review: 4.0 out of 5 stars
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Product Description
Electron Microscopy covers all of the important aspects of electron microscopy for biologists, including theory of scanning and transmission, specimen preparation, digital imaging and image analysis, laboratory safety and interpretation of images. The text also contains a complete atlas of ultrastructure. ... Read more

Customer Reviews (9)

2-0 out of 5 stars Good INTRODUCTION; not for in-depth study
This book is a good INTRO for undergrads who are interested in VERY GENERAL aspects of Electron Microscopy, but if you're starting your grad studies on the subject, or really want to learn the different techniques it is really not useful.

If you're interested in biological techniques for electron microscopy, the best and most in-depth book available on the subject is M.A. Hayat's Principles and Techniques in Electron Microscopy, which is very detailed (the 2000 edition is unavailable, but you can buy the 1993 edition or read the newest one on google books).

However, if your subject of interest are the physical principles of the electron microscope (and you are a biologist), although a bit old, Sjöstrand's book Electron Microscopy of Cells and Tissues is a very good reference, as well as Wischnitzer's Introduction to Electron Microscopy and Meek's Practical Electron Microscopy for Biologists.

4-0 out of 5 stars Excellent book
This book is really excellent for beginners to learn electron microscopy because it offers a large and detailed overview on history and techniques used on transmission and scanning electron microscopy.

On the other hand, experts will prefer a more detailed one.


5-0 out of 5 stars Good book to start with
This book is very good for biologists who start to learn EM techniques. It covers all of the important aspects of electron microscopy for biologists, including theory of scanning and transmission, specimen preparation, digital imaging and image analysis, laboratory safety and interpretation of images.

5-0 out of 5 stars Perfect!
The book is really brand new with fine pressing. I appreciate your sending very much!

3-0 out of 5 stars Was not bad on shipping time, but NOT NEW as listed.
I must give credit to the seller for great packaging and timely shipping. Although, the item was specified as being a brand NEW text book. When in fact it had scuff marks and dinges all around the cover and insides, but still in descent condition. The price I feel should have been lower for the item. ... Read more


4. Advanced Computing in Electron Microscopy
by Earl J. Kirkland
Hardcover: 289 Pages (2010-08-31)
list price: US$129.00 -- used & new: US$103.20
(price subject to change: see help)
Asin: 1441965327
Average Customer Review: 4.5 out of 5 stars
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Product Description

This book provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help interpret and understand high resolution information in recorded electron micrographs. This revised edition contains new sections on recent instrumental developments and updated references. It should be useful for beginning and experienced users at the advanced undergraduate or graduate level.

This new edition will be a revision of the existing text, including new developments in this field since the original manuscript and updated references.  Additional material will include abberration corrected instruments and confocal electron microscopy. The references and examples will be improved and expanded and some sections polished to improve ease of understanding.

... Read more

Customer Reviews (2)

5-0 out of 5 stars A must read electron microscopy book
I have both the first edition and the second one just came out. It is definitely the best book on this topic.

4-0 out of 5 stars Good book for the dedicated transmission electron microscopist
This is an appropriate book for somebody who has already read Hirsh et al., Carter and Williams, or other introductory texts on transmission electron microscopy.In addition, the reader should have a detailed knowledge of Fourier tranforms, at the level of Bracewell.For those who have mastered Cowley's "Diffraction Physics", this book is an easy read--but still very helpful to due to its admirable brevity and focus.Authors often fall into the trap of attempting to address too many topics--only to frustrate the reader.The author, however, does not make this mistake, which is commendable.I give the book four stars instead of five only to serve as a warning to potential readers that this book is not for everyone.It is certainly not meant to be your very first book for learning transmission electron microscopy. ... Read more


5. Bioimaging: Current Techniques in Light & Electron Microscopy
by Douglas Chandler, Robert W. Roberson
Hardcover: 456 Pages (2008-09-16)
list price: US$139.95 -- used & new: US$39.99
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Asin: 0763738743
Average Customer Review: 4.0 out of 5 stars
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The development of microscopy revolutionized the world of cell and molecular biology as we once knew it and will continue to play an important role in future discoveries. Bioimaging: Current Concepts in Light and Electron Microscopy is the optimal text for any undergraduate or graduate bioimaging course, and will serve as an important reference tool for the research scientist. This unique text covers, in great depth, both light and electron microscopy, as well as other structure and imaging techniques like x-ray crystallography and atomic force microscopy. Written in a user-friendly style and covering a broad range of topics, Bioimaging describes the state-of-the-art technologies that have powered the field to the forefront of cellular and molecular biological research. ... Read more

Customer Reviews (1)

4-0 out of 5 stars Good effort
This book is a good attempt to provide a broad text for teaching and learning microscopy. The authors have tried to teach the fundamentals, and still have provided some depth for certain subjects. There are some mistakes that I am hopeful will be incorporated into a second edition. Still, I think the book is the right choice for a teaching text because it does a good job of providing the fundamentals of many basic types of microscopy. As such it is a cost-efficient alternative to the many other texts that only cover one type of microscopy in much greater detail. ... Read more


6. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
by R. Egerton
Paperback: 202 Pages (2010-11-02)
list price: US$89.95 -- used & new: US$71.97
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Asin: 1441938370
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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

... Read more

7. Scanning and Transmission Electron Microscopy: An Introduction
by Stanley L. Flegler, John W. Heckman Jr., Karen L. Klomparens
Hardcover: 240 Pages (1993-09-23)
list price: US$72.95 -- used & new: US$67.20
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Asin: 0195107519
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This authoritative volume, ideal for use in the laboratory, presents the practical and theoretical fundamentals of scanning and transmission electron microscopy--together in one convenient volume. Clear and concise explanations coupled with instructive diagrams and photographs guide you through microscope operation, image production, analytical techniques, and potential applications to various disciplines.Specimen preparation is discussed in detail, with emphasis on specific parameters for biological specimens.Since each laboratory has its own procedures, this unique book covers the essentials of scanning and transmission electron microscopy while leaving the laboratory particulars to individual discretion.Unmatched in scope and clarity--and filled with helpful diagrams, photographs, and drawings--this text offers the best introduction to scanning and transmission electron microscopy available.Due to its comprehensive coverage, the book will serve as an ideal course text in the electron microscopy classes organized for the benefit of advanced students in both the biological and physical sciences. ... Read more


8. Electron Microscopy of Model Systems, Volume 96 (Methods in Cell Biology)
Hardcover: 744 Pages (2010-09-06)
list price: US$156.00 -- used & new: US$140.39
(price subject to change: see help)
Asin: 0123810078
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This volume covers the preparation and analysis of model systems for biological  electron microscopy.This will be the first compendium covering the various aspects of sample preparation of very diverse biological systems.



 


 



Covers the preparation and analysis of model systems for biological  electron microscopy. Includes the most popular systems but also organisms that are less frequently used in cell biology. This issue presents the currently most important methods for the preparation of biological specimens. This will be the first compendium covering the various aspects of sample preparation of very diverse biological systems. ... Read more

9. Principles and Techniques of Electron Microscopy
by M. A. Hayat
 Hardcover: 267 Pages (1975-05)
list price: US$19.95 -- used & new: US$24.99
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Asin: 0442256817
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10. Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
by Joseph Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Alton D. Romig Jr., Charles E. Lyman, Charles Fiori, Eric Lifshin
 Hardcover: 840 Pages (1992-05-31)
list price: US$101.00 -- used & new: US$150.05
(price subject to change: see help)
Asin: 0306441756
Average Customer Review: 5.0 out of 5 stars
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Customer Reviews (4)

5-0 out of 5 stars Excellent book for all types of audience
It was a privilege to learn the subjects of SEM and TEM from the the author of this book himself (David Joy). This is an excellent book which starts from the basics and it depends on the researcher how deep he wanna go. The book provides in depth analysis as well if required. Great resource book.

5-0 out of 5 stars Excellent text
Goldstein et al have written a book that serves as an excellent introduction to the SEM, and is also a formidable reference.When I took SEM at NC State University, it was taught from this book.Between our professor and this text, I learned the ins and outs of the SEM, and I keep the book within arms reach whenever I'm at work.

Goldstein covers everything from the basics of operation, through image formation, sample prep, usage in particular fields of study -- everything!

If you get one SEM book, get this one.

5-0 out of 5 stars A very good text book to own
This is an excellent textbook for graduate students majoring in Materials Science. The text is easy to read, and accompanied by plenty of photographs and schematics, is easy to understand. Covers almost every aspect of SEM and X-ray micro-analysis e.g. underlying science, technology, and practical use. Each chapter begins at a basic level and gradually develops the subject to intricate detail, and depending on the level of study one may skip chapters or part of a chapter.

5-0 out of 5 stars Excellent resource for Electron Microscopists
This book, although not the newest textbook on the market, is THE textbook to have if you are looking for the history, theory or applications of electron microscopy and x-ray microanalysis.Well written, thorough andpacked full of well-designed diagrams illustrating the principlesdescribed.I've used this textbook in classroom and laboratory settingswith excellent results.Looking forward to the next edition! ... Read more


11. Three-Dimensional Structure of Wood; A Scanning Electron Microscope Study (Syracuse Wood Science Series, 2)
by B. A. Meylan, B. G. Butterfield
 Paperback: 80 Pages (1972-06)
list price: US$34.50 -- used & new: US$20.99
(price subject to change: see help)
Asin: 0815650302
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12. Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences)
by Ludwig Reimer
Paperback: 527 Pages (2010-11-02)
list price: US$179.00 -- used & new: US$142.21
(price subject to change: see help)
Asin: 3642083722
Average Customer Review: 5.0 out of 5 stars
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Product Description
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information. ... Read more

Customer Reviews (1)

5-0 out of 5 stars A very good book
This is one of the self-complete books on SEM and the related techniques for intermediate and advanced level of the SEM users or engineers.
With a huge list of references, the book explains almost all of the details of instrumentation, electron beam optics, detector strategy, physics of electron-specimen interaction, and practical applications of SEM-based imaging/analyzing techniques.

While some of the references cited are German literatures, the book provides the best guide for the SEM techniques and the underlyiong physics
for wide range of readers.

I recommend it.
... Read more


13. Scanning Transmission Electron Microscopy: Imaging and Analysis
Hardcover: 550 Pages (2010-12-10)
list price: US$169.00 -- used & new: US$135.20
(price subject to change: see help)
Asin: 1441971998
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Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

... Read more

14. Introduction to Scanning Transmission Electron Microscopy (Royal Microscopical Society Microscopy Handbooks)
by Dr Robert Keyse, Anthony J. Garratt-Reed, P.J. Goodhew, Prof Gordon Lorimer
Paperback: 128 Pages (1997-12-01)
list price: US$67.95 -- used & new: US$34.06
(price subject to change: see help)
Asin: 1859960669
Average Customer Review: 4.0 out of 5 stars
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Product Description

STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.

 

... Read more

Customer Reviews (1)

4-0 out of 5 stars Good, but not in-depth
This book gave me a quick and readable introduction to the STEM.Good work on the writers' part.

However, this is a short book, and doesn't go into much detail.It would be a good book for someone just starting out in STEM, but anyone with STEM experience might find only a few bits and pieces of the book enlightening. ... Read more


15. Transmission Electron Microscopy and Diffractometry of Materials
by Brent Fultz, James M. Howe
Hardcover: 758 Pages (2007-10-11)
list price: US$129.00 -- used & new: US$77.39
(price subject to change: see help)
Asin: 3540738851
Average Customer Review: 3.5 out of 5 stars
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Product Description

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM. This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. The book explains the fundamentals of how waves and wave functions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

... Read more

Customer Reviews (4)

3-0 out of 5 stars There are better books out there
I bought this book for a TEM/Diffraction class. A friend summed it up nicely: all the information you could want about TEM is in this book, but boy, do you have to dig for it.

Often rambling; hard to get the important concepts due to the large amount of verbose text. Problems in back of chapters often hard to solve unless you are making just the right assumptions. This is too bad, since Fultz's work is often interesting and his conversational style could be nice if it was reigned in a bit.

Get Willams and Carter for all practical purposes. The book from Goodhew, Humphreys, and Beanland is less mathematically rigorous than Fultz's but much more effective at getting concepts across. Egerton's book seems to be common, but I find it to be a bit too brief for me. There are a zillion TEM/Diffraction books out there, spend an afternoon in the library and choose one that suits your learning style.

1-0 out of 5 stars Redudant and unclear
I cannot agree with the previous comments at all. Among all the books I've read in the area of materials characterization, this book is one of, if not, the most tedious one. Some concepts should have been explained in a much more concise and clear way. The description is very redundant and intimidating. The author fails to include more experimental contents but tells you where the sum of a geometric series comes from. Among many concepts and terms, the author smugly add much useless description which brings you nothing but headache. Other books, such as the famous TEM textbook by Williams and Carter, is obviously much much better than this one.

5-0 out of 5 stars Excellent TEM book
This is now my go-to source for TEM information.Its very readable, yet has loads of information about the specific modes and analysis of TEM data.Its a good book to learn from and a pretty good reference.

5-0 out of 5 stars wrote by TEM expert
This book is concise and comprehensive. Own it if you want to master TEM. ... Read more


16. Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
by Patrick Echlin
Hardcover: 330 Pages (2009-03-19)
list price: US$99.00 -- used & new: US$70.97
(price subject to change: see help)
Asin: 0387857303
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This Handbook is a complete guide to preparing a wide variety of specimens for the scanning electron microscope and x-ray microanalyzer. Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, liquids, and gases. While the Handbook complements the best-selling textbook, Scanning Electron Microscopy and X-Ray Microanalysis, Third Edition, by Goldstein, et al., it is entirely self-contained and describes what is needed up to the point the sample is put into the instrument. Photomicrographs of each specimen complement the many sample preparation “recipes”. Additional chapters describe the general features of specimen preparation in relation to the different needs of scanning electron microscopes and x-ray microanalyzers, and an appendix covers chemicals and equipment applicable to any of the recipes. This authoritative yet practical Handbook is an essential reference for anyone who uses these instruments, and assumes only an elementary knowledge of preparation techniques to guide the reader through the specific protocols.

... Read more

17. Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
by S. J. B. Reed
Paperback: 212 Pages (2010-06-10)
list price: US$31.99 -- used & new: US$26.26
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Asin: 052114230X
Average Customer Review: 4.0 out of 5 stars
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Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories. ... Read more

Customer Reviews (1)

4-0 out of 5 stars Excellent Book on the Basics
This book is great for someone who has a little background in physics and calculus. It gives a good breakdown of how the probe works and what kinds of analyses it works best for. This is not an in-depth book on quatitativeanalyses, but rather, an excellent place to start! ... Read more


18. Electron Microscopy and Analysis, Third Edition
by Peter J. Goodhew, John Humphreys, Richard Beanland
Paperback: 254 Pages (2000-11-30)
list price: US$65.95 -- used & new: US$30.00
(price subject to change: see help)
Asin: 0748409688
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Editorial Review

Product Description
The new edition of this comprehensive introductory text has been extensively revised and updated. The text is liberally illustrated and now incorporates questions and answers with each chapter. Already an established laboratory manual, this edition will be essential reading for both the materials scientist and the bio-scientist. ... Read more


19. Electron Diffraction in the Electron Microscope (Monographs in practical electron microscopy in materials science)
by J.W. Edington
 Paperback: 132 Pages (1975-12)

Isbn: 0333182928
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20. Transmission Electron Microscopy: Physics of Image Formation (Springer Series in Optical Sciences)
by Ludwig Reimer, Helmut Kohl
Paperback: 590 Pages (2010-11-02)
list price: US$159.00 -- used & new: US$159.00
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Asin: 144192308X
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Editorial Review

Product Description
Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration corrector, and energy filtering; moreover the new topics of the fourth edition have been updated again. ... Read more


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